technical data iso k line serial link interface rev. 00 the il33290 is a serial link bus interface device designed to provide bidirectional half-duplex communication interfacing in automotive diagnostic applications. it is designed to interface between the vehicle.s on-board microcontroller and systems off- board the vehicle via the special iso k line. the il33290 is designed to meet the diagnostic systems iso9141 specificat ion. the device?s k line bus driver.s output is fu lly protected against bus shorts and overtemperature conditions. the il33290 derives its robus tness to temperature and voltage extremes by bei ng built on a process, incorporating cmos l ogic, bipolar/mos analog circuitry, and dmos power fets. although the il33290 was principally designed for automotive applications, it is suited for other serial co mmunication applications. it is parametrically specifi ed over an ambient tem perature range of -40c t a 125c and 8.0 v v bb 18 v supply. the economical so-8 su rface-mount plastic package makes the il33290 very cost effective. il33290 features ? designed to operate over wide supply voltage of 8.0 to 18 v ? ambient operating temper ature of -40 to 125c ? interfaces directly to standard cmos microprocessors ? iso k line pin protected against shorts to ground ? thermal shutdown with hysteresis ? maximum transmission speeds in excess of 50 k baud ? iso k line pin capable of high currents ? iso k line can be driven with up to 10 nf of parasitic capacitance ? 8.0 kv esd protection attainable with few additional components standby mode: no vbat current drain with v at 5.0 v ? dd ? low current drain during operation with v dd at 5.0 v
il33290 pin function description notes 1. nc pins should not have any connections m ade to them. nc pins are not guaranteed to be open circuits. rev. 00
il33290 maximum ratings all voltages are with respect to ground unless otherwise noted. notes 2. device will survive double battery jump start conditions in typical applications for 10 minutes duration, but is not guaranteed to remain within specified parametric limit s during this duration. 3. esd data available upon request. 4. esd1 testing is performed in accordance with the human body model (c zap = 100 pf, r zap = 1500 ? ). 5. esd2 testing is performed in accordance with the machine model (c zap = 200 pf, r zap = 0 ? ). 6. nonrepetitive clamping capability at 25c. 7. lead soldering temperature limit is for 10 seconds maximum duration. rev. 00
il33290 rev. 00 tatic electrical characteristics der conditions of 4.75 v v 5.25 v, 8.0 v v 18 v, -40c t c 125c, s characteristics noted un dd bb unless otherwise noted. notes 8. when i bb transitions to >100 a. 9. when i bb transitions to <100 a. 10. enable pin has an internal current pull-down equivalent to greater than 50 k ? . 11. measured by ramping t x down from 0.7 v dd and noting t x value at which iso falls below 0.2 v bb . 12. measured by ramping t x up from 0.3 v dd and noting the value at which iso rises above 0.9 v bb . 13. tx pin has internal current pull-up equivalent to greater than 50 k ? . pull-up current measured with t x pin at 0.7 v dd . 14. thermal shutdown performance (t lim ) is guaranteed by design but not production tested.
il33290 rev. 00 continued) static electrical char acteristics ( characteristics noted under conditions of 4.75 v v dd 5.25 v, 8.0 v v bb 18 v, -40c t c 125c, unless otherwise noted. notes 15. iso ramped from 0.8 v bb to 0.4 v bb , monitor rx, value of iso voltage at which r x transitions to 0.3 v dd . 16. iso ramped from 0.4 vbb to 0.8 v bb , monitor rx, value of iso voltage at which r x transitions to 0.7 v dd 17. input hysteresis, v hys(iso) = v ih(iso) - v il(iso) . 18. iso has internal current limiting. .
il33290 dynamic electrical characteristics rev. 00 characteristics noted under conditions of 4.75 v v dd 5.25 v, 8.0 v v bb 18 v, -40c t c 125c, unless otherwise noted. notes 19. time required iso voltage to transition from 0.8 v bb to 0.2 v bb . 20. changes in the value of ciso affect the rise and fall time but have minimal effect on propagation delay. 21. step t x voltage from 0.2 v dd to 0.8 v dd . time measured from v ih(iso) until v iso reaches 0.3 v bb . 22. step t x voltage from 0.8 v dd to 0.2 v dd . time measured from v il(iso) until v iso reaches 0.7 v bb .
il33290 rev. 00 application information
il33290 rev. 00 package dimensions d suffix soic (ms - 012aa) symbol min max a 4.80 5.00 b 3.80 4.00 c 1.35 1.75 d 0.33 0.51 f 0.40 1.27 g h j 0 8 notes: k 0.10 0.25 1. dimensions a and b do not include mold flash or protrusion. m 0.19 0.25 2 . maximum mold flas h or protrus ion 0.15 mm (0.006) per s ide p 5.80 6.20 for a; for b ? 0.25 mm (0.010) per s ide. r 0.25 0.50 1.27 5.72 dimension, mm a b h c k c m j f m p g d r x 45 seating plane 0.25 (0.010) m t -t- 1 8 4 5
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